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written by Dean Baird
This item is a one-day high school lab investigation of factors causing short circuits in both series and parallel circuits.  Detailed lab instructions are accompanied by diagrams and prediction charts to gauge preconceived notions against the observed outcomes.  The lab materials are readily accessible and inexpensive to obtain.  This page is part of a larger online educators guide on the topic of Circuits.
Subjects Levels Resource Types
Electricity & Magnetism
- DC Circuits
- General
- High School
- Instructional Material
= Activity
= Instructor Guide/Manual
= Laboratory
= Lesson/Lesson Plan
Appropriate Courses Categories Ratings
- Physical Science
- Physics First
- Conceptual Physics
- Algebra-based Physics
- Lesson Plan
- Activity
- Laboratory
- New teachers
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Formats:
application/pdf
text/html
Access Rights:
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Restriction:
© 2002 Dean Baird
Materials may be used by teachers and students for classroom instruction. Beyond that, no part of these documents may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage or retrieval system, without permission in writing from the author.
Keywords:
circuit labs, electric circuits, electricity, short circuits
Record Cloner:
Metadata instance created June 5, 2007 by Caroline Hall
Record Updated:
July 3, 2012 by Lyle Barbato
Last Update
when Cataloged:
January 1, 2004

=)

Author: Peter Luo
Posted: June 6, 2008 at 3:38PM

that's a good introductory experiment!

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This resource is part of a Physics Front Topical Unit.


Topic: Electricity and Electrical Energy
Unit Title: Moving Charges and Electric Circuits

This one-day lab is a great way for students to investigate factors causing short circuits.  Reproducible prediction charts help students learn by gauging their preconceived ideas against observed outcomes in the lab.  Materials are readily accessible and inexpensive to obtain.

Link to Unit:
ComPADRE is beta testing Citation Styles!

Record Link
AIP Format
D. Baird, (2002), WWW Document, (http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf).
AJP/PRST-PER
D. Baird, Phyzlab: Open and Short Case - An Investigation of Faulty Circuits, (2002), <http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf>.
APA Format
Baird, D. (2004, January 1). Phyzlab: Open and Short Case - An Investigation of Faulty Circuits. Retrieved October 21, 2014, from http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf
Chicago Format
Baird, Dean. Phyzlab: Open and Short Case - An Investigation of Faulty Circuits. January 1, 2004. http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf (accessed 21 October 2014).
MLA Format
Baird, Dean. Phyzlab: Open and Short Case - An Investigation of Faulty Circuits. 2002. 1 Jan. 2004. 21 Oct. 2014 <http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf>.
BibTeX Export Format
@misc{ Author = "Dean Baird", Title = {Phyzlab: Open and Short Case - An Investigation of Faulty Circuits}, Volume = {2014}, Number = {21 October 2014}, Month = {January 1, 2004}, Year = {2002} }
Refer Export Format

%A Dean Baird
%T Phyzlab: Open and Short Case - An Investigation of Faulty Circuits
%D January 1, 2004
%U http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf
%O application/pdf

EndNote Export Format

%0 Electronic Source
%A Baird, Dean
%D January 1, 2004
%T Phyzlab: Open and Short Case - An Investigation of Faulty Circuits
%V 2014
%N 21 October 2014
%8 January 1, 2004
%9 application/pdf
%U http://marge.ragesw.com/~phyzorg/phyz/BOP/1-08CRCT/L-Open_and_Short_Case.pdf


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Phyzlab: Open and Short Case - An Investigation of Faulty Circuits:

Covers the Same Topic As PhET Simulation: Circuit Construction Kit (DC Only)

The PhET Circuit Simulator is a good choice for beginning high school physics or physical science.  Students go online to build a virtual DC circuit, using the mouse to attach wires, batteries, switches, and resistors.  This particular simulation has received excellent reviews in extensive field testing, especially when done in conjunction with a hands-on lab.

relation by Bruce Mason

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